Janice Meraglia is Vice President for Military and Government Programs at Applied DNA Sciences. She is a current team leader of two DoD Defense Logistics Agency R&D projects that focus specifically on using DNA to mitigate the risk of counterfeit electronics entering the DoD supply chain. The success of these two projects has led to the August 2012 action by DLA to mandate SigNature DNA marking of FSC 5962 microcircuits.
Ms. Meraglia’s focus is on briefing Federal Agencies and leading industry associations to highlight the power of DNA markers. Janice demonstrates the ease, flexibility and staying power of this solution as a means by which absolute, forensic authentication of originality can be determined at any and all points in the supply chain. Her primary focus has been on the microelectronic sector though Applied DNA is making headway in several other fields including, but not limited to textile authenticity, cash handling security and pharmaceutical anti-theft programs.
In addition to working with scientists and PhDs with various biological and chemical disciplines, Ms. Meraglia’s team includes seasoned professionals with electronic, logistics and government relations experience. Together her team represents a comprehensive and intelligent solution across the technical and business aspects necessary to effectively mitigate the risk of counterfeits in electronics and most other industry sectors.
Janice is a member of the G-19 Sub-committee which updated AS5553. She has also served on the TechAmerica Industry/Government Committee which developed the GEIA-STD-0016 now an Industry Standard recognized by ANSI.
Ms. Meraglia has been a featured speaker at the following industry and government conferences:
- CALCE – Center for Advanced Life Cycle Engineering
- CMSE – Components for Military and Space Electronics
- DMC – Defense Manufacturing Conference
- DMSMS – Diminishing Manufacturing Sources & Materials Shortages
- IMAPS – International Microelectronics and Packaging Society
- ISTFA – International Symposium for Testing and Failure Analysis
- LIFT – Long Island Forum for Technology
- MDA PMPB (Missile Defense Agency Parts Materials and Processes Board Meeting)
- NASA QLF (Quality Leadership Forum)
- PSMC – Parts Standardization and Management Committee
- SAE 2012 Counterfeit Electronic Parts Avoidance Symposium
Ms. Meraglia has been interviewed and quoted in several leading publications about DNA marking including Avionics Week, AOL Defense, EBN News, Circuits Assembly, Material Handling & Logistics, Government Security News, Homeland Security News Wire, EE Times and Engineering TV.
James A. Hayward, Janice Meraglia and Mitchell Miller, in, Advancing Microelectronics, Magazine of the International Microelectronics And Packaging Society (IMAPS)
May 2012 front page feature
2) “DNA Marking and Authentication: A unique, secure anti-counterfeiting program for the electronics industry”, James A. Hayward, Janice Meraglia, white paper presented and published at Center for Advanced Life Cycle Engineering (CALCE): Counterfeit Electronic Parts and Electronic Supply Chain Symposium, June 2011.
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